Citation
Mohd-Yasin, F. and Nagel, D. J. and Korman, C. E. and Ong, D. S. and Chuah, H. T. (2007) Low frequency noise measurement of three-axis surface micro-machined silicon capacitive accelerometer. In: International Semiconductor Device Research Symposium, 12-14 DEC 2007, College Pk, MD. Full text not available from this repository.
Official URL: http://apps.webofknowledge.com/full_record.do?prod...
Abstract
Low frequency noise measurement of three-axis surface micro-machined silicon capacitive accelerometer
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | T Technology > T Technology (General) Q Science > QA Mathematics > QA71-90 Instruments and machines > QA75.5-76.95 Electronic computers. Computer science |
| Divisions: | Faculty of Engineering and Technology (FET) |
| Depositing User: | Ms Suzilawati Abu Samah |
| Date Deposited: | 07 Oct 2011 06:25 |
| Last Modified: | 07 Oct 2011 06:25 |
| URII: | http://shdl.mmu.edu.my/id/eprint/3185 |
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