On the characterization of a new type of oxide-confined 850nm GaAs-based vertical-cavity surface-emitting laser

Citation

MITANI, S and CHOUDHURY, P and ALIAS, M (2008) On the characterization of a new type of oxide-confined 850nm GaAs-based vertical-cavity surface-emitting laser. Optik - International Journal for Light and Electron Optics, 119 (8). pp. 373-378. ISSN 00304026

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Abstract

Using simulation tools, results are presented for a new type of oxide-confined vertical-cavity surface-emitting laser (VCSEL) to be operated at 850 nm region of the electromagnetic spectrum. The structural details for the device are illustrated. The novelty of the device lies in that the low-doped DBR layers as well as the barrier reduction layers within the DBRs are introduced for the device fabrication, which finally provide much better efficiency of the proposed VCSEL structure. Simulations have been performed for the analyses of several features of the VCSEL that primarily govern the operational characteristics of the device. A very small deviation from the proposed structure will essentially affect the features of the output light. (C) 2007 Elsevier GmbH. All rights reserved.

Item Type: Article
Subjects: T Technology > T Technology (General)
Q Science > QA Mathematics > QA71-90 Instruments and machines > QA75.5-76.95 Electronic computers. Computer science
Divisions: Faculty of Engineering and Technology (FET)
Depositing User: Ms Suzilawati Abu Samah
Date Deposited: 19 Sep 2011 03:45
Last Modified: 19 Sep 2011 03:45
URII: http://shdl.mmu.edu.my/id/eprint/2815

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