Items where Author is "Islam, Md. Saiful"
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Khatun, Mst. Rokeya and Al Farid, Fahmid and Dhar, Sharith and Islam, Md. Saiful and Uddin, Jia and Abdul Karim, Hezerul (2026) CBAM-enhanced lightweight CNN for wafer map defect classification. Frontiers in Electronics, 7. ISSN 2673-5857