Items where Author is "Islam, Md. Saiful"
 | Up a level |
Group by: Item Type | No Grouping
Number of items: 1.
Khatun, Mst. Rokeya and Al Farid, Fahmid and Dhar, Sharith and Islam, Md. Saiful and Uddin, Jia and Abdul Karim, Hezerul (2026) CBAM-enhanced lightweight CNN for wafer map defect classification. Frontiers in Electronics, 7. ISSN 2673-5857