Citation

Sim, Kok Swee and Teh, V. and Nia, Mohsen Esmaeili (2015) Adaptive noise Wiener filter for scanning electron microscope imaging system. Scanning, 38 (2). pp. 148-163. ISSN 0161-0457

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Abstract

Noise on scanning electron microscope (SEM) images is studied. Gaussian noise is the most common type of noise in SEM image. We developed a new noise reduction filter based on the Wiener filter. We compared the performance of this new filter namely adaptive noise Wiener (ANW) filter, with four common existing filters as well as average filter, median filter, Gaussian smoothing filter and the Wiener filter. Based on the experiments results the proposed new filter has better performance on different noise variance comparing to the other existing noise removal filters in the experiments.

Item Type:	Article
Uncontrolled Keywords:	Wiener filter; electron microscope; noise; signal-to-noise ratio
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Divisions:	Faculty of Engineering and Technology (FET)
Depositing User:	Ms Rosnani Abd Wahab
Date Deposited:	21 Nov 2017 09:29
Last Modified:	21 Nov 2017 09:29
URII:	http://shdl.mmu.edu.my/id/eprint/6505

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