Citation
Sim, Kok Swee and Teh, V. and Nia, Mohsen Esmaeili (2015) Adaptive noise Wiener filter for scanning electron microscope imaging system. Scanning, 38 (2). pp. 148-163. ISSN 0161-0457 Full text not available from this repository.
Official URL: http://doi.org/10.1002/sca.21250
Abstract
Noise on scanning electron microscope (SEM) images is studied. Gaussian noise is the most common type of noise in SEM image. We developed a new noise reduction filter based on the Wiener filter. We compared the performance of this new filter namely adaptive noise Wiener (ANW) filter, with four common existing filters as well as average filter, median filter, Gaussian smoothing filter and the Wiener filter. Based on the experiments results the proposed new filter has better performance on different noise variance comparing to the other existing noise removal filters in the experiments.
Item Type: | Article |
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Uncontrolled Keywords: | Wiener filter; electron microscope; noise; signal-to-noise ratio |
Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
Divisions: | Faculty of Engineering and Technology (FET) |
Depositing User: | Ms Rosnani Abd Wahab |
Date Deposited: | 21 Nov 2017 09:29 |
Last Modified: | 21 Nov 2017 09:29 |
URII: | http://shdl.mmu.edu.my/id/eprint/6505 |
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