Citation
Koh, S. (2013) Materials Engineering; Studies from Multimedia University in the Area of Materials Engineering Published. Journal of Engineering. p. 5115. Full text not available from this repository.
Official URL: http://search.proquest.com/docview/1318042773?acco...
Abstract
According to news originating from Cyberjaya, Malaysia, by VerticalNews correspondents, research stated, "The effective copper diffusivity (D-eff) in boron-doped silicon wafer was measured using a Dynamic Secondary Ion Mass Spectrometry (D-SIMS) that was incorporated with an out-drift technique.
| Item Type: | Article |
|---|---|
| Subjects: | T Technology > T Technology (General) |
| Divisions: | Faculty of Engineering (FOE) |
| Depositing User: | Ms Suzilawati Abu Samah |
| Date Deposited: | 25 Sep 2013 01:56 |
| Last Modified: | 25 Sep 2013 01:56 |
| URII: | http://shdl.mmu.edu.my/id/eprint/4137 |
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