Citation

Sim, Kok Swee and Bukhori, Iksan and Ong, Dominic Chee Yong and Gan, Kok Beng (2025) Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review. IEEE Access, 13. pp. 154395-154421. ISSN 2169-3536

Full text not available from this repository.

Abstract

Scanning Electron Microscopy (SEM) is critical in nanotechnology, materials science, and biological imaging due to its high spatial resolution and depth of focus. Signal-to-noise ratio (SNR) is an essential parameter in SEM because it directly impacts the quality and interpretability of the images. SEM is widely used in various scientific disciplines, but its utility can be compromised by noise, which degrades image clarity. This review explores multiple aspects of the SEM imaging process, from the principal operation of SEM, sources of noise in SEM, methods for SNR measurement and estimations, to various aspects that affect the SNR measurement and approaches to enhance SNR, both from a hardware and software standpoint. We review traditional and emerging techniques, focusing on their applications, advantages, and limitations. The paper aims to provide a comprehensive understanding of SNR optimization in SEM for researchers and practitioners and to encourage further research in the field.

Item Type:	Article
Uncontrolled Keywords:	Detector sensitivity, electron beam, image quality, noise reduction, scanning electron microscope (SEM), SEM noise, signal-to-noise ratio (SNR), SEM review, SNR estimation, SEM image improvement.
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800-8360 Electronics > TK7871 Electronics--Materials
Divisions:	Faculty of Engineering and Technology (FET)
Depositing User:	Ms Suzilawati Abu Samah
Date Deposited:	30 Sep 2025 08:35
Last Modified:	30 Sep 2025 08:35
URII:	http://shdl.mmu.edu.my/id/eprint/14615

Downloads

Edit (login required)