Compact Pattern Display Tester for Reconfigurable Intelligent Surface

Citation

Mohamad Nor, Mohd Hafiz and Mohamad Marzuki, Azah Syafiah and Mohd Hassan, Siti Maisurah and Bujang, Suhandi and Sulaiman, Azlan and Alias, Mohamad Yusoff (2025) Compact Pattern Display Tester for Reconfigurable Intelligent Surface. In: 22nd International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology, ECTI-CON 2025, 20 May 2025 - 23 May 2025, Bangkok.

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Abstract

Reconfigurable Intelligent Surface (RIS) is a candidate for 6G which reflects signals to enhance coverage in the last mile or blocked areas. A matrix of antennas adjusts via a user interface to a certain pattern for a targeted direction by a controller. In this paper, a Pattern Display Tester for RIS is proposed. Due to different conditions and environments where RIS are placed over time, faulty issues are possible to occur. Software alone might not show the real condition of the hardware. Testing of any data flow state or pattern updates can be visualized from software to hardware. Potentially any faulty can be compared between the RIS on-site and the tester. The display can also assist in testing simulations in the lab without the antenna.

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: Antennas, data flow analysis
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800-8360 Electronics
Divisions: Faculty of Engineering (FOE)
Depositing User: Ms Rosnani Abd Wahab
Date Deposited: 30 Sep 2025 01:42
Last Modified: 04 Oct 2025 08:12
URII: http://shdl.mmu.edu.my/id/eprint/14533

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