Items where Author is "Yeo, V.S.H."
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Chin, J.W.C. and Kok, C.K. and Rajmohan, M.M. and Yeo, V.S.H. and Said, M.R. (2012) Investigating the Effects of Lead Forming Parameters on Intermetallic Layer Crack Using the Finite-Element Method. Journal of Electronic Materials, 41 (4). pp. 774-781. ISSN 0361-5235