Items where Author is "Yeap, Z.X."
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Sim, Kok Swee and Lim, M.S. and Yeap, Z.X. (2016) Performance of signal-to-noise ratio estimation for scanning electron microscope using autocorrelation Levinson-Durbin recursion model. Journal of Microscopy, 263 (1). pp. 64-77. ISSN 0022-2720; eISSN: 1365-2818