Items where Author is "WHITE, J. D."
 | Up a level |
Group by: Item Type | No Grouping
Number of items: 1.
SIM, K. S. and WHITE, J. D. (2005) New technique for in-situ measurement of backscattered and secondary electron yields for the calculation of signal-to-noise ratio in a SEM. Journal of Microscopy, 217 (3). pp. 235-240. ISSN 0022-2720