Siew, W. O. and Yapl, S. S. and Yong, T. K. and Nee, C. H. and Tou, T. Y. (2011) Effects of phase explosion in pulsed laser deposition of nickel thin film and sub-micron droplets. Applied Surface Science, 257 (7). pp. 2775-2778. ISSN 0169-4332

Yap, S. S. and Siew, W. O. and Nee, C. H. and Tou, T. Y. (2011) Parametric studies of diamond-like carbon by pulsed Nd:YAG laser deposition. Diamond and Related Materials, 20 (3). pp. 294-298. ISSN 0925-9635

Low, P. L. and Yong, B. E. and Ong, B. H. and Matsumoto, M. and Tou, T. Y. (2011) Substrate effects on surface morphologies and magnetic properties of nanostructured FePt thin films. Journal of Nanoscience and Nanotechnology, 11 (3). pp. 2640-2643. ISSN 1533-4880

Lee, W. P. and Yow, H. K. and Tou, T. Y. (2006) Characterization of Crystal-Originated Particles in Silicon Nitride Doped, CZ-Grown Silicon Wafers. Journal of The Electrochemical Society, 153 (3). G248-G252. ISSN 00134651

Lee, W. P. and Teh, E. P. and Yow, H. K. and Choong, C. L. and Tou, T. Y. (2005) Enhanced gettering of iron impurities in bulk silicon by using external direct current electric field. Journal of Electronic Materials, 34 (7). L25-29. ISSN 0361-5235

Lee, W. P. and Yow, H. K. and Tou, T. Y. (2004) Detection of Kite-Shaped COPs in Nitrogen-Doped Czochralski-Grown Silicon Wafers. Electrochemical and Solid-State Letters, 7 (11). G282-G285. ISSN 10990062

Lee, W. P. and Teh, E. P. and Yow, H. K. and Choong, C. L. and Tou, T. Y. (2004) Polysilicon Encapsulation Gettering with Electric-Field-Enhanced Isothermal Annealing for Copper Impurities in Bulk Silicon. Electrochemical and Solid-State Letters, 7 (12). G299-G301. ISSN 10990062

Lee, W. P. and Seow, W. S. and Yow, H. K. and Tou, T. Y. (2001) Analysis of Atomic Force Microscopy Images of Crystal Originated “Particles” on Silicon Wafers Treated with NH4OH:H2O2:H2O Solution. Japanese Journal of Applied Physics, 40 (Part 1, No. 1). pp. 18-23. ISSN 0021-4922

Lim, H. C. and Ng, S. W. and Tou, T. Y. (2000) Crystal structure of (dibenzoylmethanato) catecholato)boron(center dot)catechol. Main Group Metal Chemistry, 23 (11). pp. 727-728. ISSN 0334-7575