Items where Author is "Sim,, KS"
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Sim,, KS and Chuah,, HT and Kamel,, NS (2005) The Scanning Electron Microscope (SEM) assessment system using the autoregressive (AR) technique. Vision '05: Proceedings of the 2005 International Conference on Computer Vision . pp. 219-225.
Sim,, KS and Phang, , JCH and Thong, , JTL (2004) Effect of shot noise and secondary emission noise in scanning electron microscope images. SCANNING, 26 (1). pp. 36-40. ISSN 0161-0457