Items where Author is "SIM, K. S."

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Article

SIM, K. S. and TSO, C. P. and TAN, Y. Y. and LIM, W. K. (2007) Real-time image quality assessment with mixed Lagrange time delay estimation autoregressive (MLTDEAR) model. Journal of Microscopy, 226 (3). pp. 230-243. ISSN 0022-2720

SIM, K. S. and CHUAH, H. T. and ZHENG, C. (2005) Performance of a mixed Lagrange time delay estimation autoregressive (MLTDEAR) model for single-image signal- to-noise ratio estimation in scanning electron microscopy. Journal of Microscopy, 219 (1). pp. 1-17. ISSN 0022-2720

SIM, K. S. and WHITE, J. D. (2005) New technique for in-situ measurement of backscattered and secondary electron yields for the calculation of signal-to-noise ratio in a SEM. Journal of Microscopy, 217 (3). pp. 235-240. ISSN 0022-2720

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