Items where Author is "Roberts, John S."
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Kim, F. Li and Duu, S. Ong and David, John P. R. and Tozer, Richard C. and Rees, Graham J. and Plimmer, Stephen A. and Keng, Y. Chang and Roberts, John S. (2000) Avalanche noise characteristics of thin GaAs structures with distributed carrier generation. IEEE Transactions on Electron Devices, 47 (5). pp. 910-914. ISSN 0018-9383