Items where Author is "Quek, Wei Chun"
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Quek, Wei Chun and Pang, Wai Leong and Chan, Kah Yoong and Lee, It Ee and Chung, Gwo Chin (2020) VHDL Modelling of Low-CostMemory Fault Detection Tester. Journal of Engineering Technology and Applied Physics, 2 (2). pp. 17-23. ISSN 26828383