Lee, W. P. and Yow, H. K. and Tou, T. Y. (2006) Characterization of Crystal-Originated Particles in Silicon Nitride Doped, CZ-Grown Silicon Wafers. Journal of The Electrochemical Society, 153 (3). G248-G252. ISSN 00134651

Lee, W. P. and Teh, E. P. and Yow, H. K. and Choong, C. L. and Tou, T. Y. (2005) Enhanced gettering of iron impurities in bulk silicon by using external direct current electric field. Journal of Electronic Materials, 34 (7). L25-29. ISSN 0361-5235

Lee, W. P. and Yow, H. K. and Tou, T. Y. (2004) Detection of Kite-Shaped COPs in Nitrogen-Doped Czochralski-Grown Silicon Wafers. Electrochemical and Solid-State Letters, 7 (11). G282-G285. ISSN 10990062

Lee, W. P. and Teh, E. P. and Yow, H. K. and Choong, C. L. and Tou, T. Y. (2004) Polysilicon Encapsulation Gettering with Electric-Field-Enhanced Isothermal Annealing for Copper Impurities in Bulk Silicon. Electrochemical and Solid-State Letters, 7 (12). G299-G301. ISSN 10990062

Lee, W. P. and Seow, W. S. and Yow, H. K. and Tou, T. Y. (2001) Analysis of Atomic Force Microscopy Images of Crystal Originated “Particles” on Silicon Wafers Treated with NH4OH:H2O2:H2O Solution. Japanese Journal of Applied Physics, 40 (Part 1, No. 1). pp. 18-23. ISSN 0021-4922