Items where Author is "Dhar, Sharith"
 | Up a level |
Group by: Item Type | No Grouping
Number of items: 2.
Khatun, Mst. Rokeya and Al Farid, Fahmid and Dhar, Sharith and Islam, Md. Saiful and Uddin, Jia and Abdul Karim, Hezerul (2026) CBAM-enhanced lightweight CNN for wafer map defect classification. Frontiers in Electronics, 7. ISSN 2673-5857
Akram, Muhammad Waqar and Dhar, Sharith and Al Farid, Fahmid and Islam, Md Saiful and Uddin, Jia and Mansor, Sarina (2026) A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention. PLOS One, 21 (4). e0346595. ISSN 1932-6203