Citation

Teo, Lay Lian and Wong, Eng Kiong and Cheang, Pei Ling (2019) Carrier Transport Properties of GAN in High Electric Field. International Journal of Recent Technology and Engineering, 8 (3S). pp. 88-93. ISSN 2277-3878

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Abstract

The Monte Carlo (MC) simulation of the carrier transport mechanisms including impact ionization at high electric field in GaN is presented. Two non-parabolic conduction and valence bands were considered for the simulation of transport properties of electron and hole respectively. The carriers’ drift velocity and energy are simulated as a function of applied electric field at room temperature. The maximum velocity of electron is 2.85 × 107 cm/s at 140 kV/cm. The velocity of electron is saturated at 2 × 107 cm/s at electric field greater than 300 kV/cm. In our work, the velocity of hole is 5 × 106 cm/s at 500 kV/cm. Electron energy increases as the electric field increase and fluctuated at electric field greater than 600 kV/cm when impact ionization occurred. The impact ionization rates are obtained by using modified Keldysh equation. The hole impact ionization rate is higher than that of electron. This work also shows higher electron impact ionization coefficient than that of hole at electric field greater than 4.04 MV/cm.

Item Type:	Article
Uncontrolled Keywords:	drift velocity, Gallium nitride, impact ionization, Monte Carlo method
Subjects:	Q Science > QA Mathematics > QA273-280 Probabilities. Mathematical statistics
Divisions:	Faculty of Engineering and Technology (FET)
Depositing User:	Ms Rosnani Abd Wahab
Date Deposited:	06 Sep 2021 15:14
Last Modified:	06 Sep 2021 15:14
URII:	http://shdl.mmu.edu.my/id/eprint/8750

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