Citation

Au, Benedict Wen Cheun and Chan, Kah Yoong and Sin, Yew Keong and Ng, Zi Neng (2017) Hot-point probe measurements of N-type and P-type ZnO films. Microelectronics International, 34 (1). pp. 30-34. ISSN 1356-5362

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Abstract

Purpose - This paper aims to develop a low-cost hot-point which can facilitate the conductivity type of N-type and P-type zinc oxide (ZnO) films. In this study, a diode was made out of the N-type and P-type ZnO films, and current-voltage (I-V) characteristic measurements were conducted. Design/methodology/approach - A low-cost hot-point probe consists of a soldering iron station, digital multimeter and a pair of probes. The setup is adopted to identify N-type and P-type ZnO films. In particular, P-type films have been deployed for the first time. Findings - Hot-point probe setup has been successfully developed. Measurements of N-type films give a positive voltage reading, whereas P-type films give a negative voltage reading. The measured voltage dominates at 1 per cent for N-type Ga and at 15 per cent for P-type Na. I-V characteristics of the fabricated diode showed a similar trend to the conventional diode. Research limitations/implications - N-type has been often attempted. However, P-type has rarely been attempted because of the self-compensation effect in ZnO. There is a need to verify the conductivity type of ZnO films, especially P-type, as P-type films are not stable. The hot-point probe setup serves as a quick means to verify P-type ZnO films. Originality/value - To the best of the authors' understanding, this verification tool was developed and deployed to verify the N-type and P-type ZnO films. The P-type films are coated on top of the N-type films for diode I-V measurements.

Item Type:	Article
Uncontrolled Keywords:	semiconductor technology
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800-8360 Electronics > TK7871 Electronics--Materials
Divisions:	Faculty of Engineering (FOE)
Depositing User:	Ms Rosnani Abd Wahab
Date Deposited:	05 Nov 2020 18:31
Last Modified:	05 Nov 2020 18:31
URII:	http://shdl.mmu.edu.my/id/eprint/7134

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