Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms


Lee, Jia Keat and Phon-Amnuaisuk, Somnuk and Chew, Huat Chin and Ho, Chin Kuan (2007) Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms. In: International Symposium on Information Technology Convergence, 23-24 NOV 2007 , Jeonju, SOUTH KOREA.

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Due to the circuit complexity and the number of parameters involved, test relationship of a Test Program (TP) might not be fully discovered. Traditionally, TP setup are defined based on the domain expertise and gathered experience of an engineer. Such judgment is time consuming and could be inefficient especially when new products and technologies are rapidly developed for the competing market. If the complexity of a TP increases, the undetected interrelationship among tests in a TP will also increase. In this paper, inferences are performed to a huge and complex TP using different classification algorithms, with the primary goal to discover potential test relationships in a fast and efficient way. The mining output can be used as a reference and basis for test engineers to improve TP setup or to reprogram test machine to replace current exhaustive test policy.

Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > T Technology (General)
Q Science > QA Mathematics > QA71-90 Instruments and machines > QA75.5-76.95 Electronic computers. Computer science
Divisions: Faculty of Engineering and Technology (FET)
Depositing User: Ms Suzilawati Abu Samah
Date Deposited: 07 Oct 2011 05:57
Last Modified: 07 Oct 2011 05:57


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