Uncovering Cross-Cultural Emotional Patterns: t-SNE and PCA on Micro-Expressions

Citation

Nandagobalan, Nheelam Mitthera and Wong, Lai Kuan and Le Callet, Patrick and Kung, Fabian Wai Lee and See, John Su Yang (2025) Uncovering Cross-Cultural Emotional Patterns: t-SNE and PCA on Micro-Expressions. In: IEEE International Conference on Multimedia and Expo Workshops: Journey to the Center of Machine Imagination, ICMEW 2025 - Proceedings, 30 June 2025 - 4 July 2025, Nantes, France.

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Abstract

Facial Expression Recognition (FER) has advanced significantly in recent years, yet its generalizability remains a challenge, as existing FER methods often overlook ethnic variations in emotional expression. Micro-expressions are brief, involuntary facial movements that reveal genuine emotions, making them particularly useful for understanding subtle contrasts across cultural contexts. In this study, we analyze cultural differences in micro-expressions by integrating data from two publicly available datasets; with Southern European and Eastern Asian participants sourced from 4DME, and White British participants from SAMM. The integrated dataset, SAMM+4DME, comprises five common features extracted using ethnicity annotation and features matching via filtering and AU standardization techniques. Visualization of dimensionality reduced features using t-SNE and PCA reveal distinct clusters that highlight significant variations in micro-expression patterns across ethnic groups. This finding emphasizes the necessity of culture-aware FER systems to enhance the generalizability of micro-expression recognition across diverse populations.

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: Cross-cultural analysis, facial expression Recognition, Micro-Expression (ME), PCA, t-SNE
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Divisions: Faculty of Computing and Informatics (FCI)
Faculty of Artificial Intelligence & Engineering (FAIE)
Depositing User: Nurin Syazwani Azmi
Date Deposited: 07 Nov 2025 06:55
Last Modified: 07 Nov 2025 06:55
URII: http://shdl.mmu.edu.my/id/eprint/14777

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