Monte Carlo Simulations Of Avalanche Multiplication, Noise And Speed In Submicron InP

Citation

You , Ah Heng (2005) Monte Carlo Simulations Of Avalanche Multiplication, Noise And Speed In Submicron InP. PhD thesis, Multimedia University.

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Abstract

A stochastic nature of avalanche photodiode (APD) model is developed using Monte Carlo method to study the avalanche characteristics in submicron InP p= -i- n+ diodes. The avalanche characteristics such as multiplication gain, excess noise factor and avalanche built-up time in submicron InP p+ -i-n+ diodes are presented. A realistic FUll Band Monte Carlo (FBMC) model using empirical local pseudopotential band structure is used to simulate multiplication gain, excess noise factor and time response of InP p+ -i-n+ diodes. A simple and fast Random Path Length (RPL) model incorporating the dead-space effect is developed to reproduce the avalanche characteristics of short InP p+ -i-n+ diodes.

Item Type: Thesis (PhD)
Subjects: Q Science > QA Mathematics > QA299.6-433 Analysis
Divisions: Faculty of Engineering (FOE)
Depositing User: Ms Rosnani Abd Wahab
Date Deposited: 06 Jul 2010 06:29
Last Modified: 06 Jul 2010 06:29
URII: http://shdl.mmu.edu.my/id/eprint/840

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