Steady-state and transient electron transport in silicon: From bulk to monolayer

Citation

Yeoh, Keat Hoe and Ong, Duu Sheng (2017) Steady-state and transient electron transport in silicon: From bulk to monolayer. AIP Conference Proceedings, 1877. 080003. ISSN 1551-7616

[img] Text
30.pdf
Restricted to Repository staff only

Download (328kB)

Abstract

We carried out a systematic comparison on the steady-state and transient electron transport properties in a monolayer silicon (silicene) and bulk silicon using the semi-classical ensemble Monte Carlo method. We found that at steady state the electron drift velocity in bulk Si is higher than silicene which can be attributed to the larger phonon scattering rate of silicene. However, the transient electron drift velocity of silicene can increase up to 2.6 × 107 cm/s at applied electric field of 40 kV/cm, which is 30 % higher than the peak overshoot value of bulk Si. This advantage is not preserved at steady state condition. Based on the drift velocity overshoot characteristics, we conclude that silicene offers a better advantage than bulk Si when the device dimension is less than 20 nm.

Item Type: Article
Uncontrolled Keywords: Electron transport
Subjects: Q Science > QC Physics > QC170-197 Atomic physics. Constitution and properties of matter Including molecular physics, relativity, quantum theory, and solid state physics
Divisions: Faculty of Engineering (FOE)
Depositing User: Ms Rosnani Abd Wahab
Date Deposited: 21 Oct 2020 14:46
Last Modified: 26 Oct 2020 15:38
URII: http://shdl.mmu.edu.my/id/eprint/7061

Downloads

Downloads per month over past year

View ItemEdit (login required)