Contactor characterization methodology on pin inductance


Ling, Li Ong and Chan, Yee Kit and You, Ah Heng (2014) Contactor characterization methodology on pin inductance. In: 2014 IEEE International Conference on Semiconductor Electronics (ICSE). IEEE, pp. 9-12. ISBN 978-1-4799-5760-6

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Contactor pin is commonly used as the test tooling to enable million times of repeatability functional testing in manufacturing. Simulation should be performed before contactor sent for prototyping. The objective is to optimize the design according to device performance and avoid design faulty which may lead to higher testing cost. This paper introduces the methodology on contactor pin characterization specifically the pin inductance that are helpful for high speed tooling engineer to access their contactor's performances. The impact of the contactor pin design, topology and contactor housing design will be explained in this paper. Indirectly, this is to emphasize the importance of assessing the contactor by considering many design factors instead of assessing in ideal way. It is widely applicable to any electronic devices testing that need contactor.

Item Type: Book Section
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Divisions: Faculty of Engineering and Technology (FET)
Depositing User: Ms Nurul Iqtiani Ahmad
Date Deposited: 18 Nov 2014 04:59
Last Modified: 18 Nov 2014 04:59


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