Vacuum Shear Force Microscopy Application to High Resolution Work

Polonski, Vitali V. and Yamamoto, Yoh and White, Jonathon D. and Kourogi, Motonobu (1999) Vacuum Shear Force Microscopy Application to High Resolution Work. Japanese Journal of Applied Physics, 38 (2). pp. 826-829. ISSN 0021-4922

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Official URL: http://adsabs.harvard.edu/abs/1999JaJAP..38L.826P

Abstract

A new technique–Vacuum Shear Force Microscopy (VSFM)–is introduced as a reliable method for maintaining a constant separation between a probe and sample. Elimination of many of the instabilities observed when applying the shear force mechanism to imaging under ambient conditions, allows for routine nanometer lateral and sub-nanometer normal resolution. In this paper this technique is applied, firstly, to the imaging of microtubules (biology) and, secondly, to the patterning and subsequent imaging of nanoscale metal lines (nanofabrication).

Item Type: Article
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Divisions: Faculty of Engineering (FOE)
Depositing User: Ms Nurul Iqtiani Ahmad
Date Deposited: 11 Sep 2013 07:22
Last Modified: 28 Oct 2013 04:05
URI: http://shdl.mmu.edu.my/id/eprint/3980

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