Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect

Citation

Mohd-Yasin, F. and Nagel, D. J. and Ong, D. S. and Korman, C. E. and Chuah, H. T. (2007) Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect. In: 20th International Microprocesses and Nanotechnology Conference, 05-08 NOV 2007 , Kyoto, JAPAN.

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Abstract

Low frequency noise measurement and analysis of capacitive micro-accelerometers: Temperature effect

Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > T Technology (General)
Q Science > QA Mathematics > QA71-90 Instruments and machines > QA75.5-76.95 Electronic computers. Computer science
Divisions: Faculty of Engineering and Technology (FET)
Depositing User: Ms Suzilawati Abu Samah
Date Deposited: 07 Oct 2011 08:28
Last Modified: 07 Oct 2011 08:28
URII: http://shdl.mmu.edu.my/id/eprint/3169

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