Chung, Boon-Kuan (2007) DIELECTRIC CONSTANT MEASUREMENT FOR THIN MATERIAL AT MICROWAVE FREQUENCIES. Progress In Electromagnetics Research, 75. 239-252 . ISSN 1559-8985

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A practical problem in the reflection method for dielectric constant measurement is the difficulty to ensure the sample is placed exactly at the waveguide flange. A small position offset of the dielectric sample will give rise to some errors in calculating the dielectric constant, especially when a thin sample is used. To circumvent this problem, a method to determine the dielectric constant by measuring the transmission coefficient of the thin slab placed in a waveguide has been developed. Slab position offset from the measurement reference plane has no effect on the measurement accuracy. An explicit expression for the dielectric constant is obtained in terms of the transmission coefficient by simplifying the exact solution for transmission through a thin dielectric slab. The method is verified with measurement on Teflon of 0.5-mm thickness. The measured dielectric constant of Teflon shows excellent agreement of both epsilon ' and epsilon '' with published data. Subsequently, the dielectric constant of a vegetation leaf was measured.

Item Type: Article
Subjects: T Technology > T Technology (General)
Q Science > QC Physics
Divisions: Faculty of Engineering and Technology (FET)
Depositing User: Ms Suzilawati Abu Samah
Date Deposited: 04 Oct 2011 02:46
Last Modified: 04 Oct 2011 02:46
URII: http://shdl.mmu.edu.my/id/eprint/3120


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