Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology

Ke, Joseph Kian Seng (2005) Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology. Masters thesis, Multimedia University.

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Abstract

In semiconductor industry, cycle time of the wafer fabrication is very crucial and one of the contributing factors comes from wafer testing. This thesis presents the application of back propagation Artificial Neural Network (ANN) model designed to infer electrical test parameters from the given list of parameters with the intention of reducing test time, to enhance throughput, and to improve cycle time.

Item Type: Thesis (Masters)
Subjects: Q Science > QA Mathematics > QA75.5-76.95 Electronic computers. Computer science > QA76.75-76.765 Computer software
Divisions: Faculty of Engineering (FOE)
Depositing User: Ms Rosnani Abd Wahab
Date Deposited: 19 Aug 2010 08:19
Last Modified: 19 Aug 2010 08:19
URI: http://shdl.mmu.edu.my/id/eprint/1214

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