Real Time Metrological Grade Monitoring Stations With AI Analysis

Citation

Kok, Adrian Eng Hock and Chan, Yee Kit and Koo, Voon Chet (2023) Real Time Metrological Grade Monitoring Stations With AI Analysis. In: 1st FET PG Engineering Colloquium Proceedings 2023, 16 June - 15 July 2023, Multimedia University, Malaysia. (Submitted)

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Abstract

Air pollution is one the major contributor to global warming. The research will bring a step closer to enable monitoring of air pollutions particularly on the particle measurements with accuracy of metrological stations with Internet of Things (IOT) node as a medium of gathering sensors data and ease of mass deployment.

Item Type: Conference or Workshop Item (Poster)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800-8360 Electronics
Divisions: Faculty of Engineering and Technology (FET)
Depositing User: Ms Nurul Iqtiani Ahmad
Date Deposited: 15 Aug 2023 01:38
Last Modified: 15 Aug 2023 01:38
URII: http://shdl.mmu.edu.my/id/eprint/11620

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