Items where Author is "Tou, Teckyong"

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Article

Koh, Songfoo and You, Ahheng and Tou, Teckyong (2013) Copper diffusivity in boron-doped silicon wafer measured by dynamic secondary ion mass spectrometry. Materials Science and Engineering: B, 178 (5). pp. 321-325. ISSN 09215107

This list was generated on Fri Mar 29 19:27:36 2024 +08.