Article

Lee, Meng Chuan and Wong, Hin Yong (2016) Investigation on the Charge Loss Mechanisms of Nanoscale Charge Trap Non-Volatile Memory by Using Stretched Exponential Function. Journal of Nanoscience and Nanotechnology, 16 (1). pp. 663-669. ISSN 1533-4880

Lee, Meng Chuan and Wong, Hin Yong (2015) Investigation on the origin of the anomalous tail bits on nitrided charge trap flash memory. Microelectronics Reliability, 55 (2). pp. 337-341. ISSN 0026-2714

Lee, Meng Chuan and Wong, Hin Yong (2014) Investigation on the impact of program/erase cycling frequency on data retention of nanoscale charge trap nonvolatile memory. IEEE Electron Device Letters, 35 (9). pp. 918-920. ISSN 0741-3106

Lee, Meng Chuan and Wong, Hin Yong (2014) Threshold voltage instability mechanisms of nitride based charge trap flash memory-A review. Journal of Nanoscience and Nanotechnology, 14 (7). pp. 4799-4812. ISSN 1533-4880

Lee, Meng Chuan and Wong, Hin Yong and Lee, Lini (2014) Threshold voltage instability of nanoscale charge trapping non-volatile memory at steady phase. Microelectronics Reliability, 54. pp. 2392-2395. ISSN 0026-2714

Lee, Meng Chuan and Wong, Hin Yong and Lee, Lini (2014) Investigation on the effect of tunnel oxide nitridation to threshold voltage instability mechanisms of nanoscale CT NVM. Solid-State Electronics. ISSN 0038-1101

Lee, Meng Chuan and Wong, Hin Yong (2014) The impact of tunnel oxide nitridation to reliability performance of charge storage non-volatile memory devices. Journal of Nanoscience and Nanotechnology, 14 (2). ISSN 1508-1520

Thesis

Lee, Meng Chuan (2015) Threshold voltage instability on nitride based localized charge trap non-volatile memory devices. PhD thesis, Multimedia University.