Materials Engineering; Studies from Multimedia University in the Area of Materials Engineering Published

Koh, S. (2013) Materials Engineering; Studies from Multimedia University in the Area of Materials Engineering Published. Journal of Engineering. p. 5115.

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Abstract

According to news originating from Cyberjaya, Malaysia, by VerticalNews correspondents, research stated, "The effective copper diffusivity (D-eff) in boron-doped silicon wafer was measured using a Dynamic Secondary Ion Mass Spectrometry (D-SIMS) that was incorporated with an out-drift technique.

Item Type: Article
Subjects: T Technology > T Technology (General)
Divisions: Faculty of Engineering (FOE)
Depositing User: Ms Suzilawati Abu Samah
Date Deposited: 25 Sep 2013 01:56
Last Modified: 25 Sep 2013 01:56
URI: http://shdl.mmu.edu.my/id/eprint/4137

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