Frontside And Backside Fault Localization Techniques On IC Leakage Failures

Lau, Chee Kiang (2011) Frontside And Backside Fault Localization Techniques On IC Leakage Failures. Masters thesis, Multimedia University.

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Abstract

This research is established to characterize and compare the techniques in terms of their sensitivity in detecting the fault location in common semiconductor failures.New methods are also proposed as alternative techniques which include the backside emission microscopy and backside liquid crystal thermography.

Item Type: Thesis (Masters)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Engineering and Technology (FET)
Depositing User: Users 1102 not found.
Date Deposited: 18 Dec 2012 03:21
Last Modified: 18 Dec 2012 03:21
URI: http://shdl.mmu.edu.my/id/eprint/3699

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