Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs

Lee, Jia Keat (2008) Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs. Masters thesis, Multimedia University.

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Abstract

A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively.

Item Type: Thesis (Masters)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800-8360 Electronics
Divisions: Faculty of Computing and Informatics (FCI)
Depositing User: Ms Rosnani Abd Wahab
Date Deposited: 23 Sep 2010 02:17
Last Modified: 23 Sep 2010 02:17
URI: http://shdl.mmu.edu.my/id/eprint/1667

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